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Niche Markets and Strategies for Small/Mid-size Semiconductor
Equipment Companies |
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TABLE OF CONTENTS |
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Chapter 1 |
Introduction |
1-1 |
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Chapter 2 |
Niche Markets for
PROCESSES for 300mm Wafers |
2-1 |
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2.1 |
Introduction |
2-1 |
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2.2 |
Wafer Level
Processing (WLP) |
2-3 |
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2.2.1 |
Introduction |
2-3 |
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2.2.2 |
Flip
Chip/WLP Processing Issues and Trends |
2-4 |
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o |
Wafer
Bumping |
2-4 |
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o |
Wafer Level Packaging |
2-8 |
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o |
Pad
Redistribution |
2-12 |
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o |
Wafer Bumping Costs |
2-18 |
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2.2.3 |
Lithography
Issues And Trends |
2-20 |
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2.2.4 |
UBM Etch Issues And Trends |
2-21 |
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2.2.5 |
Metallization
Issues and Trends |
2-25 |
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o |
Gold
Bumping Metallization |
2-25 |
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o |
Solder
Bumping Metallization |
2-27 |
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2.2.6 |
Analysis
of WLP Market |
2-29 |
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2.3 |
3-D TSV |
2-32 |
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2.3.1 |
Insight
Into Critical Issues |
2-32 |
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2.3.2 |
Cost
Structure |
2-33 |
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2.3.3 |
Critical Processing Technologies |
2-40 |
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2.3.4 |
Evaluation
Of Critical Development Segments |
2-46 |
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2.3.5 |
TSV
Device Forecast |
2-52 |
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2.4 |
Non-volatile
Memory Devices MRAM, RRAM and FeRAM |
2-55 |
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2.4.1 |
Processing
Requirements for MRAMs |
2-60 |
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2.4.2 |
Processing
Requirements for RRAMs |
2-62 |
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2.4.3 |
Processing
Requirements for FeRAMs |
2-65 |
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2.4.4 |
Roadmap
for Commercialization |
2-67 |
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2.5 |
Ultrathin Wafers |
2-70 |
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2.5.1 |
Applications
for Ultrathin Wafers |
2-70 |
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2.5.2 |
Substrate Thinning |
2-71 |
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2.5.3 |
Backside
Metallization Requirements |
2-77 |
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2.5.4 |
Surface Stress Relief |
2-79 |
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2.5.5 |
Ultrathin Wafer
Market |
2-81 |
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Chapter 3 |
Niche Markets for
EQUIPMENT for SUB 300mm Wafers |
3-1 |
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3.1 |
Introduction |
3-1 |
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3.2 |
MEMs |
3-3 |
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3.2.1 |
The MEMS Market Infrastructure |
3-3 |
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3.2.2 |
Forecast
Of The Key Applications And Markets |
3-5 |
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MEMS
Device Market Forecast |
3-5 |
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MEMS
System Market Forecast |
3-17 |
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3.2.3 |
Markets
for Equipment and Materials Suppliers |
3-20 |
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3.3 |
HB-LEDs |
3-40 |
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3.3.1 |
Recent Progress in High
Brightness LED Technology and Applications |
3-40 |
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3.3.2 |
Processing Equipment |
3-49 |
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3.3.3 |
Materials of
Construction |
3-61 |
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3.3.4 |
OLED Manufacturing |
3-65 |
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3.3.5 |
Outlook for the
Worldwide OLED Market |
3-68 |
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3.3.6 |
Outlook for the
Worldwide HB-LED Market |
3-72 |
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3.4 |
Compound
Semiconductors |
3-83 |
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3.4.1 |
GaAs
Devices |
3-83 |
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3.4.2 |
Equipment
Trends |
3-92 |
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3.4.3 |
Wafer Sizes |
3-104 |
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3.4.4 |
GaAs IC Market Forecast |
3-107 |
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3.4.5 |
Competing
Against SiGe |
3-109 |
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3.5 |
Thin Film
Read/Write Heads for HDD |
3-116 |
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3.5.1 |
Trends
in HDDs |
3-117 |
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3.5.2 |
Recording
Head Market Forecast |
3-126 |
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3.5.3 |
Head
Processing |
3-129 |
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3.5.4 |
Head
Fabrication – CMP, Deposition, Lithography |
3-134 |
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3.5.5 |
CMP
Challenges |
3-139 |
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3.5.6 |
Lithography
Challenges |
3-145 |
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3.6 |
Bulk Acoustic
Wave (BAW) |
3-148 |
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3.6.1 |
Basic Elements of the BAW Device |
3-150 |
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3.6.2 |
AlN Layer Quality Requirements |
3-153 |
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3.6.3 |
Equipment
Requirements for BAW and FBAR Filtering Devices |
3-157 |
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3.6.4 |
Bulk
Acoustic Wave (BAW) Market |
3-158 |
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TABLES |
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2.1 |
Common
UBM Stacks For Solder And Gold Bumping |
2-5 |
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2.2 |
Solder
Bumping Guidelines |
2-7 |
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2.3 |
ITRS
Pin Counts For Different Applications |
2-9 |
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2.4 |
Pillar-WLP
CSP Guidelines |
2-14 |
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2.5 |
Pad
Redistribution Guidelines |
2-17 |
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2.6 |
UBM Film Etchants |
2-24 |
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2.7 |
Common
UBM Stacks For Gold And Solder Bumping |
2-26 |
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2.8 |
WLP
Demand By Device (Units) |
2-30
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2.9 |
WLP
Demand By Device (Wafers) |
2-31
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2.10 |
Forecast
Of TSV Devices By Wafers |
2-53 |
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3.1 |
MEMS
Device Markets |
3-6 |
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3.2 |
MEMS
System Markets |
3-19 |
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3.3 |
MEMS
Equipment Markets |
3-21 |
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3.4 |
Color,
Wavelength Material Of LED |
3-42 |
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3.5 |
Comparison of LED, HB-LED, UHB-LED Characteristics |
3-48 |
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3.6 |
Epitaxy
Metrics from Initial Solid-State Lighting Manufacturing R&D Roadmap |
3-55 |
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3.7 |
Process Control Metrics |
3-57 |
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3.8 |
Production Method for Various LEDs |
3-62 |
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3.9 |
GaAs
IC Market Forecast |
3-108 |
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3.10 |
Comparison
Of Piezoelectric Materials For BAW Applications |
3-154 |
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FIGURES |
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2.1 |
Solder
Bumping Process |
2-6 |
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2.2 |
Pillar-WLPCSP
Process |
2-13 |
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2.3 |
Pad
Redistribution Process |
2-16 |
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2.4 |
Via
First (iTSV) Cost Of Ownership |
2-34 |
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2.5 |
Via
First (iTSV) Cost Of Ownership Front And Back Side |
2-36 |
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2.6 |
Via
First (iTSV) Process Flow |
2-37 |
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2.7 |
iTSV
Versus pTSV Cost Of Ownership |
2-38 |
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2.8 |
Effect
Of TSV Depth And Diameter On Cost |
2-39 |
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2.9 |
Illustration
Of Bosch Process |
2-43 |
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2.10 |
Process
And Equipment Flow For EMC3D Consortium Members |
2-47 |
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2.11 |
Various TSV Integration Schemes |
2-49 |
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2.12 |
Forecast
OF TSV Devices By Wafers |
2-54 |
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3.1 |
Operation
of LED |
3-41 |
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3.2 |
Market
drivers for LED Biz and Applications |
3-45 |
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3.3 |
SSL
vs. Classical Technologies |
3-46 |
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3.4 |
LED
Performance vs. Traditional Light Sources |
3-47 |
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3.5 |
Pareto
Analysis Of SSL Manufacturing Costs |
3-52 |
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3.6 |
Nanoimprint
Lithography System |
3-60 |
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3.7 |
Regular
LED (white) Front-End Steps |
3-63 |
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3.8 |
Schematic
of AMOLED |
3-69 |
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3.9 |
Active
Matrix OLED Capacity and Demand Forecast |
3-70 |
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3.10 |
LED Market by Sector
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3-81 |
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3.11 |
Worldwide
LED Market Forecast
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3-82 |
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3.12 |
Schematic
of GaAs MESFET |
3-84 |
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3.13 |
Schematic
of GaAs HEMT Device |
3-86 |
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3.14 |
Schematic
of GaAs HBT Device |
3-89 |
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3.15 |
Schematic
of GaAs HBT Device |
3-91 |
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3.16 |
pHEMT MMIC Process
Flow Chart |
3-93 |
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3.17 |
0.15
Micron 3MI Process Cross Section |
3-99 |
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3.18 |
InGaP HBT Process |
3-102 |
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3.19 |
Worldwide
SiGe Market Forecast |
3-115 |
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3.20 |
Hard
Disk Drive Roadmap |
3-118 |
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3.21 |
Decrease
In Average Price Of Storage |
3-119 |
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3.22 |
Heads
Per Drive
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3-121 |
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3.23 |
Increase
In Areal Density |
3-123 |
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3.24 |
Market
Forecast Of Recording Head Consumption |
3-127 |
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3.25 |
Heads
Per Drive Forecast |
3-128 |
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3.26 |
Thin
Film Head Structure |
3-130 |
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3.27 |
Critical
Features In Thin Film Head Structure |
3-131 |
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3.28 |
Spin
Valve Head Structure |
3-132 |
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3.29 |
Cross-Sectional
View TFH Stacks |
3-135 |
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3.30 |
Cross-Sectional
View Of A TFH Design |
3-136 |
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3.31 |
CMP
Slurry System For Tfh Wafer Polishing |
3-143 |
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3.32 |
Critical
Feature Trends In Thin Film Heads |
3-146 |
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3.33 |
Application
Space For Rf Filters |
3-149 |
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3.34 |
FBAR
Diagram |
3-151 |
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3.35 |
BAW-SMR
Diagram |
3-152 |
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3.36 |
Worldwide
BAW Forecast |
3-159 |
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