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LCD
Market:
Technology
Directions and Market Analysis |
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Chapter 1 |
Introduction |
1-1 |
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Chapter 2 |
Executive Summary |
2-1 |
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2.1 |
Introduction |
2-1 |
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2.2 |
Market Opportunities |
2-3 |
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Chapter 3 |
Profiles of Japanese Companies |
3-1 |
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3.1 |
Equipment Manufacturers |
3-1 |
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3.2 |
Material Manufacturers |
3-14 |
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3.3 |
LCD Manufacturers |
3-23 |
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Chapter 4 |
Profiles of US Companies |
4-1 |
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4.1 |
Equipment Manufacturers |
4-1 |
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4.2 |
Material Manufacturers |
4-11 |
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4.3 |
LCD Manufacturers |
4-13 |
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Chapter 5 |
Profiles of ROW Companies |
5-1 |
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5.1 |
Equipment Manufacturers |
5-1 |
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5.2 |
Material Manufacturers |
5-5 |
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5.3 |
LCD Manufacturers |
5-8 |
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Chapter 6 |
The AMLCD Factory |
6-1 |
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6.1 |
Factory Logistics |
6-1 |
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6.1.1 |
Investment Needs |
6-1 |
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6.1.2 |
Capacity |
6-6 |
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6.1.3 |
Plant Size |
6-8 |
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6.2 |
Cleanrooms |
6-9 |
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6.3 |
Automation |
6-13 |
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6.4 |
Active Matrix LCD Production Trends |
6-16 |
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6.4.1 |
TFT - a-Si |
6-17 |
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6.4.2 |
TFT - Polysilicon |
6-27 |
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6.4.3 |
MIM LCD |
6-32 |
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6.4.4 |
Reflective Arrays |
6-33 |
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6.5 |
Passive Matrix LCD Production Trends |
6-34 |
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6.5.1 |
TN LCDs |
6-34 |
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6.5.2 |
STN LCDs |
6-37 |
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6.5.3 |
VAN LCDs |
6-39 |
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6.5.4 |
Ferroelectric LCDs |
6-40 |
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6.6 |
New Approaches |
6-45 |
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6.6.1 |
LCD Monitors |
6-47 |
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6.6.2 |
Plastic LCDs |
6-59 |
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Chapter 7 |
Equipment Requirements and Trends |
7-1 |
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7.1 |
Microlithography |
7-1 |
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7.1.1 |
Proximity Printing |
7-1 |
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7.1.2 |
Scanning Projection |
7-2 |
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7.1.3 |
Step-and-Repeat |
7-3 |
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Image Field Stitching |
7-7 |
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o |
Overlay |
7-7 |
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7.2 |
Deposition |
7-8 |
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7.2.1 |
CVD |
7-8 |
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7.2.2 |
Sputtering |
7-13 |
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7.3 |
Rapid Thermal Processing |
7-15 |
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7.4 |
Etch/Strip/Clean |
7-17 |
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7.4.1 |
Etching |
7-17 |
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Plasma Etching |
7-17 |
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Wet Chemical Etching |
7-19 |
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7.4.2 |
Photoresist Stripping |
7-21 |
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7.4.3 |
Cleaning |
7-24 |
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7.5 |
Inspection Systems |
7-27 |
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7.6 |
Test Systems |
7-28 |
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7.6.1 |
Technology Capabilities |
7-28 |
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Voltage/Capacitance Imaging |
7-29 |
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o |
Ohmic/Continuity Test |
7-29 |
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Charge Sensing |
7-29 |
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o |
Forward Admittance Sensing |
7-30 |
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E-Beam Test |
7-30 |
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7.6.2 |
Yield Improvements |
7-31 |
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7.7 |
Repair |
7-33 |
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Chapter 8 |
Material Requirements and Trends |
8-1 |
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8.1 |
Substrates |
8-1 |
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8.1.1 |
Material Types |
8-1 |
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8.1.2 |
Quality Issues |
8-2 |
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8.1.3 |
Trends |
8-4 |
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Larger Substrates |
8-4 |
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o |
Thinner Substrates |
8-7 |
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o |
Better Surface |
8-7 |
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o |
Higher Temperature Capability |
8-8 |
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Manufacturers |
8-8 |
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8.2 |
Liquid Crystals |
8-10 |
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8.2.1 |
Introduction |
8-10 |
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8.2.2 |
New Polar Materials |
8-12 |
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8.2.3 |
Polymer Dispersed Liquid Crystals |
8-12 |
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8.2.4 |
OLEDs |
8-13 |
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8.2.5 |
Light-Emitting Polymers |
8-14 |
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8.3 |
Alignment Layer |
8-25 |
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8.3.1 |
Material Properties |
8-25 |
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8.3.2 |
Material Trends |
8-28 |
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8.4 |
Color Filters |
8-28 |
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8.4.1 |
Materials |
8-28 |
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8.5 |
Polarizer Films |
8-32 |
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8.5.1 |
Material Properties and Trends |
8-32 |
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Chapter 9 |
Market Forecast |
9-1 |
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9.1 |
Getting To Market |
9-1 |
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9.2 |
Market Forecast Assumptions |
9-6 |
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9.3 |
LCD Market Forecast |
9-7 |
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9.4 |
Equipment Market Forecast and Trends |
9-29 |
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9.4.1 |
Lithography |
9-29 |
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9.4.2 |
Plasma Etching and Stripping |
9-32 |
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9.4.3 |
Thin Film Deposition |
9-34 |
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9.4.4 |
Wet Etching and Cleaning |
9-36 |
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9.4.5 |
Photoresist Processing |
9-38 |
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9.4.6 |
Inspection/Repair |
9-40 |
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9.4.7 |
Total Equipment Market |
9-42 |
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9.5 |
Materials Market Forecast |
9-46 |
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LIST OF
FIGURES |
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6.1 |
SMIF Concept |
6-14 |
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6.2 |
Amorphous Silicon AM Fabrication Process |
6-18 |
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6.3 |
AMLCD Cross Section |
6-19 |
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6.4 |
Polysilicon AM Fabrication Process |
6-30 |
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6.5 |
Twisted Nematic LCD |
6-38 |
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7.1 |
Schematic of Step-and-Repeat Aligner |
7-5 |
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7.2 |
Schematic of Hot-Wall LPCVD Reactors |
7-10 |
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7.3 |
Schematic of PECVD Techniques |
7-12 |
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7.4 |
Diagram of Magnetron Sputtering Source |
7-14 |
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7.5 |
Diagram of Rapid Thermal Processor |
7-16 |
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8.1 |
Light-Emitting Polymer Structure |
8-16 |
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8.2 |
LEP Structure Cross Section |
8-18 |
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8.3 |
Ink-Jet Printing Of Lep Structure |
8-23 |
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9.1 |
Worldwide Large Panel Display Market Forecast |
9-18 |
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9.2 |
Worldwide LCD PC Monitor Market Forecast |
9-19 |
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9.3 |
North American LCD TV Market Forecast |
9-21 |
| 9.4 | North American Plasma TV Market Forecast |
9-22 |
| 9.5 | Production Lines in Operation By Generation |
9-31 |
| 9.6 | Worldwide AMLCD Equipment Market Growth |
9-45 |
| 9.7 | Worldwide Large Area LCD Glass Consumption By Generation |
9-48 |
| 9.8 | Worldwide Large Area LCD Glass Consumption By Region |
9-49 |
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LIST OF
TABLES |
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6.1 |
USDC Manufacturer and Developer Members |
6-5 |
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6.2 |
Causes of Defects in TFT LCD Manufacturing |
6-12 |
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6.3 |
Comparison of Various Passive Matrix LCDs |
6-35 |
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7.1 |
Common Wafer Processing Chemicals |
7-20 |
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7.2 |
Photoresist Stripping Solutions |
7-22 |
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7.3 |
Advantages and Disadvantages of Various Cleaning Methods |
7-25 |
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8.1 |
Manufacturing Facilities |
8-6 |
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8.2 |
Desired Nematic LC Material Characteristics |
8-11 |
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8.3 |
Performance Of LEPs |
8-21 |
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8.4 |
Characteristics of Aligning Materials |
8-27 |
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8.5 |
Characteristics of Color Filter Methods |
8-30 |
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9.1 |
Worldwide Mobile Phone Display Market Forecast |
9-16 |
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9.2 |
Worldwide LCD Display Market Forecast |
9-19 |
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9.3 |
Worldwide AMLCD Stepper/Scanner Market Forecast |
9-30 |
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9.4 |
Worldwide Market Forecast of AMLCD Plasma Etching |
9-33 |
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9.5 |
Forecast of Worldwide AMLCD Thin Film Deposition
Equipment Market |
9-35 |
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9.6 |
Forecast of Worldwide AMLCD Wet Etching and Cleaning
Equipment Market |
9-37 |
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9.7 |
Forecast of Worldwide AMLCD Photoresist Processing Equipment
Market |
9-39 |
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9.8 |
Forecast of Worldwide AMLCD Inspection/Repair Equipment Market |
9-41 |
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9.9 |
Forecast of Worldwide AMLCD Equipment Market |
9-44 |